Skolkovo Institute of Science and Technology
Main Services Advanced Imaging Core Facility
Scanning electron microscope Quattro S
Particle morphology investigation
Surface morphology investigation of the sample, if necessary, the use of a backscattered electron detector
Investigation of the elemental composition of the sample (by 5 points)
Investigation of the elemental composition of the sample (mapping of 3 areas)
Dual beam scanning electron microscope Helios G4
Particle morphology investigation
Surface morphology investigation of the sample, if necessary, the use of a backscattered electron detector
Investigation of the elemental composition of the sample (by 5 points)
Investigation of the elemental composition of the sample (mapping of 3 areas)
Preparation and visualization of cross-section
Preparation of lamella for TEM investigation
Preparation of lamella for TEM investigation at the given point in accordance with Customer request
Investigation of multilayer structures in the STEM mode, including investigation of the elemental composition of the sample (along the line)
Investigation of the crystallographic orientation of the grain structure (EBSD)
Transmission electron microscope Titan Themis Z
Investigation of the morphology of nanoparticles in TEM or STEM modes
Investigation of the grain structure of a sample including determination of dislocation density
Investigation of the crystal structure of a sample using electron diffraction
Visualization of the crystal structure of the sample in high resolution TEM or STEM
Solution of the crystal structure of a sample using electron diffraction tomography
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